Xenics Onca enables accurate and affordable thermal analysis

Xenics Onca enables accurate and affordable thermal analysis

Leuven, Belgium, March 2010 --- Xenics, Europe's leading developer and manufacturer of advanced infrared detectors and imaging solutions for the LWIR to the visible realm, presents the unique "TrueThermal" feature of its versatile MWIR Onca camera family. Onca is a high-quality, affordable IR thermal imaging system available with 320 or 640 line resolution, choice of MCT or InSb detector, aiming for industrial and scientific applications that benefit from Xenics' stable non uniformity correction technique to eliminate frequent recalibrations at varying integration times.

Xenics' "TrueThermal" technique, realizing a temperature measurement accuracy within +1°C,reduces the need for frequent recalibrations by providing an innovative stable non uniformity correction (NUC). The measurement capabilities include three radiometric temperature ranges of 0°C – 100°C, 60°C – 400°C, and 0°C – 1000°C.

Another unique feature of the Xenics Onca family is its substantially extended filter stacking capability. The depth of the filter holders allows multiple “standard” filters to be stacked. The Onca filter holder also accepts custom filters. Most other filter mechanisms will hold just standard filters 25 mm in diameter and 1 mm thick. The Onca filter wheel can be equipped with up to five filters for multi-spectral measurements.

The user can program the onca to change both filter position and integration time with each image taken. This flexibility, combined with the stable thermal calibration across integration times enables the new SuperFraming mode: high dynamic thermal images are created in real time from user defined integration times and enables viewing hot and cold spots in one sequence for high-speed process monitoring.

Xenics' Onca family is a high-end IR and thermal imaging platform with cooled detector claiming top position in the competitive ranking. Available with either MCT or InSb detector head, Onca is suited for scientific applications as well as industrial process monitoring, high-speed imaging, target signature radiometric data collection, tracking and IR spectroscopy. Onca offers extended midwave range (MWIR) coverage from 3.7 to 4.8 μm (optionally 1.0 to 5.0μm), supporting all-weather and night-vision applications.

Across this broad range of applications, Onca can increase the frame rate while reducing overhead for high-speed process monitoring in windowing mode.

Camera control and image acquisition are laid out for more than 100 images per second, and are compatible with GigE Vision and CameraLink for easy integration in customers' systems. Image export is done in real time at >100 fps. The software driver is fully compatible with Windows 2000 Workstation and XP Pro. An API with sample code in C, Visual Basic and Delphi is available, as are LabView drivers. A DLL library enables flexible software development.

Onca is optimized for stand-alone or PC-driven operation and advanced real-time image correction. Its state-of-the-art 2D MCT or InSb detector array is available at a 320 x 256, or high-definition 640 x 512 pixel resolution with sensitivity (NETD) <20 mK. The camera offers 14-bit images at various frame rates. Two speed versions are available: standard video, or high-speed 488 Hz at 320 x 256. All camera functions are customizable and settings are stored in non-volatile memory. Onca can optionally be offered with the recording and analysis tool Thermography Studio, a comprehensive thermal analysis interface for dynamic events.

For the Onca camera family, Xenics provides a broad array of MWIR lens options fine tuned and geared to the user's application. The compact (250 L x 170 W x 190 H mm³) and sturdy metal casing is of an anti-condensing type construction. Total weight excluding lens is 5 kg.

World's first InGaAs camera photon emission microscope

Xenics enabled Semicaps to realize the world's first InGaAs camera photon emission microscope in 2004. Since then Xenics and sInfraRed have supported us in our endeavors for better sensitivity and resolution in photon and thermal emission microscopy.

Chua Choon Meng, CEO Semicaps