Xenics newsflash April 2017

Xenics newsflash April 2017

25/04/2017

In our first newsflash issue for the year, we review the events involving Xenics for the year thus far. Expect to obtain information about the following:

  • our participation in BiOS & Photonics West 2017
  • details about the white paper on Adaptive Optics
  • our participation in Automate 2017
  • our participation in SPIE DCS 2017
  • an interview with Raf Vandersmissen: key specs to look for in SWIR detectors
  • details about the white paper on semiconductor inspection applications
     

To never miss out on developments as they happen, be sure to follow us on our social media channels. Happy reading!  

Newflash April 2017

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The press corner contains the most relevant information about Xenics. You can find the latest press releases, product news and technology news. Our pictures and movies are also available for download in the media gallery. More:

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Versatile infrared analysis and reporting software

The Xeneth user interface is common to all the Xenics cameras. This makes it easy for customers to apply their familiarity with this comprehensive product to any new applications, covering wide ranging capabilities in various parts of the IR spectrum.

Learn it once and apply it over and over again.

Karl Niedermeyer, President, Spectro Associates, Inc.